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1

SPIE Proceedings [SPIE Industrial Lasers and Inspection (EUROPTO Series) - Munich, Germany (Monday 14 June 1999)] Computer-Controlled Microshaping - Laser-induced formation of semiconductor films based on transition-metal silicides

Mulenko, Sergey A., Ovechko, Volodymyr S., Veiko, Vadim P., Szoerenyi, Tamas

Year:

1999

Language:

english

File:

PDF, 307 KB

english, 1999

2

Femtosecond optics—optics of the elementary waves packets

Ovechko, Volodymyr S.

Journal:

Journal of the Optical Society of America B

Year:

2012

Language:

english

File:

PDF, 542 KB

english, 2012

3

Spectral Investigation of Physical Adsorption in Porous Glass

Dmytruk, Andriy, Ovechko, Volodymyr

Journal:

Surface Review and Letters

Year:

2003

Language:

english

File:

PDF, 173 KB

english, 2003

4

SPIE Proceedings [SPIE Holography, Correlation Optics, and Recording Materials - Chernovtsy, Ukraine (Monday 10 May 1993)] International Conference on Holography, Correlation Optics, and Recording Materials - Correlation technique of investigation of nonstationary laser emissions

Amerov, Airat K., Ovechko, Volodymyr S., Petrosian, Petros T., Strizshevskii, Vladimir L., Angelsky, Oleg V.

Year:

1993

Language:

english

File:

PDF, 420 KB

english, 1993

5

SPIE Proceedings [SPIE International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics - Kiev, Ukraine (Thursday 11 May 1995)] International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics - Nonlinear and interferometric optical methods of diagnostics of semiconductors

Ovechko, Volodymyr S., Dmitruk, Andrii M., Svechnikov, Sergey V., Valakh, Mikhail Y.

Year:

1995

Language:

english

File:

PDF, 303 KB

english, 1995

6

SPIE Proceedings [SPIE Optoelectronics '99 - Integrated Optoelectronic Devices - San Jose, CA (Saturday 23 January 1999)] Integrated Optics Devices III - Integrated optical sensor

Ovechko, Volodymyr S., Dmytruk, Andrij M., Mygashko, Valentyna P., Righini, Giancarlo C., Najafi, S. Iraj

Year:

1999

Language:

english

File:

PDF, 664 KB

english, 1999

7

SPIE Proceedings [SPIE International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics - Kiev, Ukraine (Tuesday 13 May 1997)] Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics 1997 - Laser radiation action on c-Si with dislocations and their diagnostics

Makara, Vladimir A., Steblenko, L. P., Pasechny, V. A., Ovechko, Volodymyr S., Petrosian, P. T., Dmitruk, Andrii M., Svechnikov, Sergey V., Valakh, Mikhail Y.

Year:

1998

Language:

english

File:

PDF, 241 KB

english, 1998